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    • IRDS™ 2016 Edition White Papers
    • International Roadmap for Devices and Systems (IRDS™) 2017 Edition
    • International Roadmap for Devices and Systems (IRDS™) 2018 Edition
      • IRDS™ 2018: Executive Summary
      • IRDS™ 2018: Application Benchmarking
      • IRDS™ 2018: Outside System Connectivity
      • IRDS™ 2018: More Moore
      • IRDS™ 2018: Factory Integration
      • IRDS™ 2018: Yield Enhancement
      • IRDS™ 2018: Metrology
      • IRDS™ 2018: Medical Devices Market Driver
      • IRDS™ 2018: Proactive Particle Control in Ultrapure Water (UPW) in Silicon Wafer Cleaning Process
      • IRDS™ 2018: Metal Contamination of Image Sensors by Ultrapure Water in Silicon Wafer Cleaning Process
      • IRDS™ 2018: Preparing for Data-Driven Systems and Architectures – Edge, Cloud, and Core
      • IRDS™ 2018: Beyond CMOS
      • IRDS™ 2018: Automotive Market Driver
      • IRDS™ 2018: Cryogenic Electronics and Quantum Information Processing
    • International Roadmap for Devices and Systems (IRDS™) 2020 Edition
    • International Roadmap for Devices and Systems (IRDS™) 2021 Edition
    • International Roadmap for Devices and Systems (IRDS™) 2022 Edition
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  • International Roadmap for Devices and Systems (IRDS™) 2018 Edition

International Roadmap for Devices and Systems (IRDS™) 2018 Edition

 

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Join the IRDS Technical Community and access the IRDS 2018 Edition Reports

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Learn how to download the roadmap documents below.

Executive Summary

Executive Summary
Executive Summary

 

International Focus Teams' Roadmap Reports:

Application Benchmarking
Application Benchmarking
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Systems and Architectures
Systems and Architectures
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Outside System Connectivity
Outside System Connectivity
More Moore
More Moore
Factory Integration
Factory Integration
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Lithography
Lithography
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Emerging Research Materials
Emerging Research Materials
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Yield Enhancement
Yield Enhancement
Metrology
Metrology
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Environmental, Safety, Health, and Sustainability
Environmental, Safety, Health, and Sustainability
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Virtual Metrology White Paper
Virtual Metrology White Paper
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Beyond CMOS
Beyond CMOS
Cryogenic Electronics and Quantum Information Processing
Cryogenic Electronics and Quantum Information Processing

 

Market Drivers:

Medical Devices Market Driver
Medical Devices Market Driver

 

White Papers:

Proactive Particle Control in Ultrapure Water (UPW) in Silicon Wafer Cleaning Process
Proactive Particle Control in Ultrapure Water (UPW) in Silicon Wafer Cleaning Process
Metal Contamination of Image Sensors by Ultrapure Water in Silicon Wafer Cleaning Process
Metal Contamination of Image Sensors by Ultrapure Water in Silicon Wafer Cleaning Process
Preparing for Data-Driven Systems and Architectures – Edge, Cloud, and Core
Preparing for Data-Driven Systems and Architectures – Edge, Cloud, and Core
Automotive Market Driver
Automotive Market Driver

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